LSI Logic Inc claims that its new FasTest technology cuts the overall ASIC design cycle in half: the family of devices is based upon the company’s one-micron LCA 100K Compacted Array Plus HCMOS gate array technology and is is the first commercial implementation of San Jose-based CrossCheck Technology Inc’s patented ASIC test and diagnostics technology; the LFT150K family offers standard MDE ASIC design methodology, and offers four additional pins for the test bus so that once the circuit is initialised and has functional patterns that toggle all nodes, 98% fault coverage can be achieved quickly.
